DocumentCode
3410425
Title
Digital image watermarking method using between-class variance
Author
Yamato, Kazuki ; Hasegawa, Mikio ; Tanaka, Yuichi ; Kato, Shigeo
Author_Institution
Grad. Sch. of Eng., Utsunomiya Univ., Utsunomiya, Japan
fYear
2012
fDate
Sept. 30 2012-Oct. 3 2012
Firstpage
2185
Lastpage
2188
Abstract
We propose a low-complexity, pixel-based watermarking method utilizing the edge areas in an image. In this method, an image is divided into blocks and the blocks are classified as edge blocks and non-edge blocks. The histogram of pixels in an edge block is a bi-modal distribution which has two peaks. Therefore, these pixels are further classified into two classes named “high peak class” and “low peak class”. Then, a bit of the watermark is embedded by controlling the between-class variance by changing the pixel values in each class of the edge block. We utilized the discriminant analysis method for deciding a threshold and controlling the between-class variance. The proposed method can improve the image quality while maintaining robustness against compression and smoothing. In this paper, we evaluated the image quality of watermarked images using PSNR and SSIM. We also evaluated robustness against JPEG compression and Gaussian filtering.
Keywords
Gaussian processes; data compression; edge detection; image classification; image coding; image watermarking; smoothing methods; Gaussian filtering; JPEG compression; PSNR; SSIM; between-class variance; bimodal distribution; digital image watermarking; discriminant analysis method; edge block; high peak class; image classification; image compression; image edge area; image quality; image smoothing; image threshold; low peak class; low-complexity pixel-based watermarking method; pixel histogram; pixel value; Filtering; Image coding; Image edge detection; Image quality; Robustness; Transform coding; Watermarking; between-class variance; discriminant analysis method; watermarking;
fLanguage
English
Publisher
ieee
Conference_Titel
Image Processing (ICIP), 2012 19th IEEE International Conference on
Conference_Location
Orlando, FL
ISSN
1522-4880
Print_ISBN
978-1-4673-2534-9
Electronic_ISBN
1522-4880
Type
conf
DOI
10.1109/ICIP.2012.6467327
Filename
6467327
Link To Document