DocumentCode :
341092
Title :
Using cereal grain permittivity for quality sensing by moisture determination
Author :
Nelson, Stuart O. ; Kraszewski, Andrzej W. ; Trabelsi, Samir ; Lawrence, Kurt C.
Author_Institution :
US Dept. of Agric., Athens, GA, USA
Volume :
1
fYear :
1999
fDate :
1999
Firstpage :
237
Abstract :
A brief history of cereal grain moisture measurement by sensing the electrical properties of grain is presented. The basic principles are also described for using radiofrequency (RF) and microwave dielectric properties or permittivity, of grain for sensing moisture through their correlation with moisture content. The development of density-independent functions of the permittivity is explained. The findings of recent research are summarized, which indicate that reliable density-independent moisture content determinations can be realized by measurements on grain at RF and microwave frequencies. Development of these techniques will provide useful instruments for on-line monitoring of moisture content in flowing grain to manage moisture in grain, prevent spoilage in storage and transport, improve processing, and provide information important for yield determinations in precision agriculture applications
Keywords :
agriculture; microwave measurement; moisture measurement; permittivity; RF dielectric properties; agriculture applications; cereal grain; density-independent functions; flowing grain; microwave dielectric properties; moisture measurement; on-line monitoring; permittivity; quality sensing; yield determinations; Density measurement; Dielectric measurements; Frequency measurement; History; Instruments; Microwave frequencies; Microwave measurements; Moisture measurement; Permittivity measurement; Radio frequency;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1999. IMTC/99. Proceedings of the 16th IEEE
Conference_Location :
Venice
ISSN :
1091-5281
Print_ISBN :
0-7803-5276-9
Type :
conf
DOI :
10.1109/IMTC.1999.776753
Filename :
776753
Link To Document :
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