Optimised CdTe sensors for measurement of electric and magnetic fields in the near field region

Author

Cecelja, Franjcl ; Balachandran, Wamadeva

Author_Institution

Dept. of Manuf. & Eng. Syst., Brunel Univ., Uxbridge, UK

Volume

1

fYear

1999

fDate

1999

Firstpage

279

Abstract

We present a novel EM field measurement system utilising optical technology which has been developed, tested and calibrated in the frequency region up to 1.8 GHz. It shows an advantage over currently available measurement systems in that it is passive, all-dielectric and EM immune. A detailed analysis of field perturbation by the measuring probes in the near field region was performed using finite-difference time-domain algorithm. Both probes were calibrated using gigahertz transversal electric and magnetic cell, and the results obtained show a linear response

Keywords

II-VI semiconductors; Pockels effect; cadmium compounds; electro-optical devices; field strength measurement; finite difference time-domain analysis; optical sensors; polarimetry; probes; 0 to 1.8 GHz; CdTe; EM field measurement system; Pockel´s effect; all-dielectric measurement system; field perturbation; finite-difference time-domain algorithm; gigahertz transversal cell; linear response; measuring probes; near field region; optical sensors; passive measurement system; polarimetry; Current measurement; Electric variables measurement; Frequency measurement; Magnetic analysis; Magnetic field measurement; Magnetic sensors; Optical sensors; Performance analysis; Probes; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 1999. IMTC/99. Proceedings of the 16th IEEE

Conference_Location

Venice

ISSN

1091-5281

Print_ISBN

0-7803-5276-9

Type

conf

DOI

10.1109/IMTC.1999.776761

Filename

776761