DocumentCode :
3410999
Title :
Conformance testing of protocols specified as communicating FSMs
Author :
Lee, David ; Sabnani, Krishan K. ; Kristol, David M. ; Paul, Sanjoy ; Uyar, M. Ümit
Author_Institution :
AT&T Bell Lab., Murray Hill, NJ, USA
fYear :
1993
fDate :
1993
Firstpage :
115
Abstract :
An approach for conformance testing of protocols specified as a collection of communicating finite state machines (FSMs) with two parts, pruning and a guided random walk procedure, is presented. First the protocol is pruned to various sets of machines; each set provides only one service. This significantly reduces the test sequence length. Then a guided random walk procedure that attempts to cover all transitions in the component FSMs is used. The results of applying the procedure to the full-duplex alternating bit protocol and the asynchronous transfer mode (ATM) adaptation layer convergence protocol are presented. For the ATM adaptation layer, 99% of component FSMs´ edges can be covered in a test with 11692 input steps. Previous approaches cannot generate conformance tests for standard protocols (such as ATM adaptation layer) specified as a collection of communicating FSMs
Keywords :
asynchronous transfer mode; conformance testing; finite state machines; protocols; ATM adaptation layer convergence protocol; FSM; asynchronous transfer mode; communicating finite state machines; conformance testing; full-duplex alternating bit protocol; guided random walk procedure; heuristic procedures; protocols; pruning; Automata; Communication networks; Communication standards; Communications technology; Convergence; Explosions; Protocols; System testing; Telecommunication network reliability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
INFOCOM '93. Proceedings.Twelfth Annual Joint Conference of the IEEE Computer and Communications Societies. Networking: Foundation for the Future, IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
0-8186-3580-0
Type :
conf
DOI :
10.1109/INFCOM.1993.253242
Filename :
253242
Link To Document :
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