Title :
Novel numerical method to correct for both circuit distortions and passive layers effect affecting Sawyer-Tower ferroelectric thin films hysteresis measurements
Author :
Bouregba, R. ; Poullain, G.
Author_Institution :
Lab. CRISMAT, Caen Univ., France
fDate :
28 May-1 June 2002
Abstract :
A novel approach is proposed to compute the ferroelectric polarization by correcting numerically for both parasitic disturbing S-T hysteresis measurements and possible interfacial layers. This is achieved by taking into account all the charges flowing in a S-T circuit.
Keywords :
dielectric hysteresis; dielectric polarisation; ferroelectric capacitors; ferroelectric thin films; permittivity; thin film capacitors; Sawyer-Tower ferroelectric thin films; circuit distortions; dielectric hysteresis measurements; ferroelectric polarization; numerical method; passive layers effect; Capacitors; Circuit testing; Distortion measurement; Ferroelectric films; Ferroelectric materials; Hysteresis; Leakage current; Oscilloscopes; Polarization; Thin film circuits;
Conference_Titel :
Applications of Ferroelectrics, 2002. ISAF 2002. Proceedings of the 13th IEEE International Symposium on
Print_ISBN :
0-7803-7414-2
DOI :
10.1109/ISAF.2002.1195858
