DocumentCode
3411449
Title
Novel numerical method to correct for both circuit distortions and passive layers effect affecting Sawyer-Tower ferroelectric thin films hysteresis measurements
Author
Bouregba, R. ; Poullain, G.
Author_Institution
Lab. CRISMAT, Caen Univ., France
fYear
2002
fDate
28 May-1 June 2002
Firstpage
11
Lastpage
14
Abstract
A novel approach is proposed to compute the ferroelectric polarization by correcting numerically for both parasitic disturbing S-T hysteresis measurements and possible interfacial layers. This is achieved by taking into account all the charges flowing in a S-T circuit.
Keywords
dielectric hysteresis; dielectric polarisation; ferroelectric capacitors; ferroelectric thin films; permittivity; thin film capacitors; Sawyer-Tower ferroelectric thin films; circuit distortions; dielectric hysteresis measurements; ferroelectric polarization; numerical method; passive layers effect; Capacitors; Circuit testing; Distortion measurement; Ferroelectric films; Ferroelectric materials; Hysteresis; Leakage current; Oscilloscopes; Polarization; Thin film circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Applications of Ferroelectrics, 2002. ISAF 2002. Proceedings of the 13th IEEE International Symposium on
ISSN
1099-4734
Print_ISBN
0-7803-7414-2
Type
conf
DOI
10.1109/ISAF.2002.1195858
Filename
1195858
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