DocumentCode :
3411502
Title :
A study on sleep EEG Using sample entropy and power spectrum analysis
Author :
See, Aaron Raymond ; Chih-Kuo Liang
Author_Institution :
Dept. of Electr. Eng., Southern Taiwan Univ., Tainan, Taiwan
fYear :
2011
fDate :
3-5 Aug. 2011
Firstpage :
1
Lastpage :
4
Abstract :
Research on the automation of sleep stage classification, particularly single channel EEG, has been a challenge for many years. The research aims to look into the analysis and evaluation of feature extraction techniques and classification methods that are important to properly classify sleep stages with limited channels. Sample entropy, and the power spectrum of the harmonic parameters using infinite impulse response filters and wavelet transform were used to extract features from the data taken from Physionet database. A total of 13 features were initially extracted and used for the training and testing of the sleep stage classification system. Analysis of the training data showed a distinct combination patterns between the sample entropy and harmonic parameters with a change in the sleep stage. In addition, a prototype for the sleep stage classification system was implemented. Support Vector Machine (SVM) was utilized for the classification system. While the training data were extracted from several database. Further refinement of the data and the program could be useful for a test the sleep stage classification on other database or data.
Keywords :
electroencephalography; entropy; feature extraction; medical signal processing; neurophysiology; pattern classification; sleep; support vector machines; wavelet transforms; Physionet database; classification method; feature extraction; harmonic parameter; infinite impulse response filter; power spectrum analysis; sample entropy analysis; single channel EEG; sleep EEG; sleep stage classification; support vector machine; wavelet transform; Electroencephalography; Entropy; Feature extraction; Power harmonic filters; Sleep; Support vector machines; Wavelet transforms; harmonic parameters; power spectrum; sample entropy; sleep stage classification; support vector machine; wavelet transform;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Defense Science Research Conference and Expo (DSR), 2011
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-9276-3
Type :
conf
DOI :
10.1109/DSR.2011.6026802
Filename :
6026802
Link To Document :
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