Title :
IEEE 1995 International Integrated Reliability Workshop. Final Report
Abstract :
The following topics were dealt with: wafer level reliability testing; wafer level reliability implementation; building-in reliability
Keywords :
integrated circuit reliability; semiconductor device reliability; semiconductor technology; building-in reliability; integrated reliability; semiconductor fabrication; wafer level reliability testing;
Conference_Titel :
Integrated Reliability Workshop, 1995. Final Report., International
Conference_Location :
Lake Tahoe, CA, USA
Print_ISBN :
0-7803-2705-5
DOI :
10.1109/IRWS.1995.493565
