DocumentCode
3411510
Title
IEEE 1995 International Integrated Reliability Workshop. Final Report
fYear
1995
fDate
22-25 Oct. 1995
Abstract
The following topics were dealt with: wafer level reliability testing; wafer level reliability implementation; building-in reliability
Keywords
integrated circuit reliability; semiconductor device reliability; semiconductor technology; building-in reliability; integrated reliability; semiconductor fabrication; wafer level reliability testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Integrated Reliability Workshop, 1995. Final Report., International
Conference_Location
Lake Tahoe, CA, USA
Print_ISBN
0-7803-2705-5
Type
conf
DOI
10.1109/IRWS.1995.493565
Filename
493565
Link To Document