• DocumentCode
    341231
  • Title

    Key comparisons of National Measurement Standards

  • Author

    Witt, Thomas J.

  • Author_Institution
    Bur. Int. des Poids et Mesures, Sevres, France
  • Volume
    2
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    768
  • Abstract
    The mutual recognition of national measurement standards is of fundamental importance as a supporting member of a modern structure of international trade in goods and services. Calibration and testing services, accreditation bodies and users of these services must have confidence that the national measurement standards upon which their work is based are indeed equivalent. A set of key comparisons of national measurement standards is the technical basis for the mutual recognition agreement drawn up by the Comite International des Poids et Mesures (CIPM) and soon to be signed by the directors of nearly forty national metrology institutes (NMI). This presentation describes how the CIPM´s Consultative Committees (CC) choose key comparisons and how they are carried out by national metrology institutes or by the Bureau International des Poids et Mesures (BIPM). This can be done (1) under the auspices of the Consultative Committees, (2) under the auspices of regional metrology organization (RMO), or simply (3) as bilateral comparisons between two institutes; but always under a set of general guidelines. The presentation describes how key comparison results are discussed and examined by the Consultative Committees and how, after approval, they will be listed in a freely available key comparison database
  • Keywords
    measurement standards; BIPM; CIPM; comparison database; consultative committee; international trade; mutual recognition agreement; national measurement standard; national metrology institute; regional metrology organization; Accreditation; Calibration; Databases; Guidelines; Integrated circuit measurements; International trade; Laboratories; Measurement standards; Metrology; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 1999. IMTC/99. Proceedings of the 16th IEEE
  • Conference_Location
    Venice
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-5276-9
  • Type

    conf

  • DOI
    10.1109/IMTC.1999.776971
  • Filename
    776971