• DocumentCode
    3412527
  • Title

    Density geodesics for similarity clustering

  • Author

    Ozertem, Umut ; Erdogmus, Deniz ; Carreira-Perpiñán, Miguel Á

  • Author_Institution
    Dept. of Comput. Sci. & Electr. Eng., Oregon Health & Sci. Univ., Portland, OR
  • fYear
    2008
  • fDate
    March 31 2008-April 4 2008
  • Firstpage
    1977
  • Lastpage
    1980
  • Abstract
    We address the problem of similarity metric selection in pairwise affinity clustering. Traditional techniques employ standard algebraic context-independent sample-distance measures, such as the Euclidean distance. More recent context-dependent metric modifications employ the bottleneck principle to develop path-bottleneck or path- average distances and define similarities based on geodesies determined according to these metrics. This paper develops a principled context-adaptive similarity metric for pairs of feature vectors utilizing the probability density of all data. Specifically, based on the postulate that Euclidean distance is the canonical metric for data drawn from a unit-hypercube uniform density, a density-geodesic distance measure stemming from Riemannian geometry of curved surfaces is derived. Comparisons with alternative metrics demonstrate the superior properties such as robustness.
  • Keywords
    differential geometry; graph theory; pattern clustering; statistical distributions; vectors; Riemannian geometry; curved surfaces; density geodesic distance measurement; feature vectors; graph theory; pairwise affinity clustering; principled context-adaptive similarity metric selection; probability distribution; similarity clustering; Computer science; Density measurement; Euclidean distance; Gaussian processes; Information geometry; Level measurement; Measurement standards; Merging; Robustness; Shape; Affinity based clustering; context dependent distance measure; similarity clustering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Acoustics, Speech and Signal Processing, 2008. ICASSP 2008. IEEE International Conference on
  • Conference_Location
    Las Vegas, NV
  • ISSN
    1520-6149
  • Print_ISBN
    978-1-4244-1483-3
  • Electronic_ISBN
    1520-6149
  • Type

    conf

  • DOI
    10.1109/ICASSP.2008.4518025
  • Filename
    4518025