Title :
Piezoelectric properties and structural characterization of (Na,Bi)Bi2Ta2O9 ceramics with bismuth layer-structure
Author :
Aoyagi, R. ; Matsushita, M. ; Komagata, K. ; Takeda, H. ; Okamura, S. ; Shiosaki, T.
Author_Institution :
Graduate Sch. of Mater. Sci., Nara Inst. of Sci. & Technol., Japan
fDate :
28 May-1 June 2002
Abstract :
The piezoelectric properties of bismuth layer-structured ferroelectrics Na0.5-xBi0.5+x3/Bi2Ta2O9 (NBT(x)) dense ceramics were investigated, and the crystal structure of synthesized NBT(x) powders was analyzed by the Rietveld method. NBT(x) powder and ceramics were prepared by conventional synthesis method. NBT(x) powder for x = 0 and x = 0.1 was confirmed to be single phase of BLSFs (m = 2) by x-ray diffraction method. The electromechanical coupling coefficients kp of NBT(x = 0) and NBT(x = 0.1) dense ceramics were 10% and 8.3%, respectively. The kp of NBT(x = 0) was one of the largest in reported non-oriented BLSFs ceramics.
Keywords :
X-ray diffraction; bismuth compounds; crystal structure; dielectric losses; dielectric polarisation; ferroelectric Curie temperature; ferroelectric ceramics; lattice constants; permittivity; piezoceramics; powder technology; sodium compounds; (NaBi)Bi2Ta2O9; Curie temperature; Rietveld method; bismuth layer-structured ferroelectrics; crystal structure; dense ceramics; dielectric constant; electrical resistivity; electromechanical coupling coefficients; lattice parameters; phase identification; piezoelectric properties; poled ceramics; single phase; tangential loss factor; temperature dependence; x-ray diffraction; Bismuth; Ceramics; Dielectric measurements; Electric resistance; Electric variables measurement; Electrical resistance measurement; Ferroelectric materials; Nonvolatile memory; Powders; Random access memory;
Conference_Titel :
Applications of Ferroelectrics, 2002. ISAF 2002. Proceedings of the 13th IEEE International Symposium on
Print_ISBN :
0-7803-7414-2
DOI :
10.1109/ISAF.2002.1195931
