Title :
Equating laboratories: modelling and analysis
Author :
Banks, David ; Eberhardt, Keith
Author_Institution :
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
Abstract :
Efficient world trade requires that manufacturers in one country have confidence that their product will meet specifications that are verified by purchasers in another country. But these trading partners rely upon different national metrology laboratories to calibrate their equipment, and there is detectable divergence between their measurement systems. This paper describes statistical methods that enable one to use data from a network of artifact comparisons to estimate the measurement functions at each participating laboratory. These methods cannot determine which laboratory is most accurate, but do allow one to predict the value that a given laboratory would obtain on an artifact from the value measured at another laboratory in the comparison network
Keywords :
Bayes methods; accreditation; calibration; laboratories; measurement systems; modelling; sampling methods; Bayesian analysis; Gibbs sampling; MENSOR program; bundles-of-lines model; calibration; conjugacy approximation; equating laboratories; frequentist analysis; measurement equivalence; measurement functions; measurement systems divergence; metrology laboratories; modelling; network of artifact comparisons; statistical methods; Calibration; Laboratories; Manufacturing; Metrology; Particle measurements; Polynomials; Software measurement; Statistical analysis; Testing; Transportation;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1999. IMTC/99. Proceedings of the 16th IEEE
Conference_Location :
Venice
Print_ISBN :
0-7803-5276-9
DOI :
10.1109/IMTC.1999.777028