• DocumentCode
    341284
  • Title

    Analysis of roughly quantized Gaussian signals

  • Author

    Chiorboli, Giovanni ; Fontanili, Massimo

  • Author_Institution
    Dipt. de Ingegneria dell´´Inf., Parma Univ., Italy
  • Volume
    2
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    1167
  • Abstract
    Experience shows that measurements on normally distributed signals are affected by a large uncertainty when the standard deviation of the signal is smaller than the quantization step. In this case, the so-called quantization noise model can not be assumed since the quantization error is correlated with the quantizer input. It is demonstrated that the correlation can be zeroed by slowly varying the mean value of the input signal within the quantization cell. This allows to obtain an accurate estimate of the input variance either when a low resolution quantizer is used. The above technique may be explained as a particular case of deterministic, narrow-band dithering. Finally, it will be shown that large-scale, random narrow-band dithering may be advantageously used when a deep knowledge of the input signal spectrum is necessary. The measurement of the different contributions to the internal noise of an A/D converter, represents a typical application of these techniques
  • Keywords
    Gaussian noise; correlation methods; error analysis; measurement errors; quantisation (signal); statistical analysis; A/D converter; deterministic narrow-band dithering; input signal spectrum; internal noise; large-scale random narrow band dithering; noise model; normally distributed signals; quantization step; roughly quantized Gaussian signals; standard deviation; uncertainty; Additive noise; Area measurement; Large-scale systems; Measurement standards; Narrowband; Noise measurement; Position measurement; Quantization; Signal analysis; Working environment noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 1999. IMTC/99. Proceedings of the 16th IEEE
  • Conference_Location
    Venice
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-5276-9
  • Type

    conf

  • DOI
    10.1109/IMTC.1999.777040
  • Filename
    777040