Title :
A 1.8V 1.6GS/s 8b self-calibrating folding ADC with 7.26 ENOB at Nyquist frequency
Author :
Taft, Rebecca ; Tursi, M.R. ; Hidri, O.
Author_Institution :
Nat. Semicond. GmbH, Furstenfeldbruck, Germany
Abstract :
A 1.8V folding-interpolating ADC in 0.18μm CMOS uses small device sizes to achieve a conversion rate exceeding 1.6GS/s. The inherent mismatch offsets are calibrated transparently, and at 1.6GS/s the ADC achieves 0.15LSB DNL, 0.35LSB INL, 7.5 ENOB at 100MHz input, and 7.26 ENOB at Nyquist.
Keywords :
CMOS integrated circuits; analogue-digital conversion; calibration; high-speed integrated circuits; interpolation; low-power electronics; 1.8 V; CMOS process; Nyquist frequency ENOB; calibration vectors; inherent mismatch offsets; interpolating ADC; self-calibrating folding ADC; small calibrated amplifiers; start-up delay; CMOS technology; Calibration; Capacitance; Frequency; Interleaved codes; Interpolation; MOSFET circuits; Resistors; Switches; Voltage;
Conference_Titel :
Solid-State Circuits Conference, 2004. Digest of Technical Papers. ISSCC. 2004 IEEE International
Print_ISBN :
0-7803-8267-6
DOI :
10.1109/ISSCC.2004.1332689
