Title :
NetConf: a single chip PCM conference circuit with automatic gain control, attenuation, noise suppression, soft reset and multiple frame synchronization timing
Author_Institution :
Dept. of Res. & Dev., Northern Electr. Telecomunikasyon A.S., Istanbul
Abstract :
This paper presents a unique 2-stage pipeline PCM conference architecture, called NetConf, specially designed and realized as a single chip VLSI for processing PCM channels in order to provide conference in digital switching systems. The NetConf conference circuit overcomes the manual handling of overflow problem, that exist in the current architectures, with a unique 2-stage pipelined architecture and a new AGC algorithm. The circuit can also provide regular connection and capable of doing 3 Level attenuation, 4 level noise suppression on all or any selected channel. The circuit can be soft reset and accept different frame synchronization timings. The conference circuit realized by European Silicon Structures´ 0.7 micron CMOS technology and packaged in a 24 pin plastic DIL package. The die is 12 mm2 and consists of 12,000 gates including two four-ports static RAMs. This newly proposed 2-stage pipeline conference architecture provides better overflow and noise performance over existing architectures
Keywords :
CMOS digital integrated circuits; VLSI; application specific integrated circuits; automatic gain control; digital signal processing chips; electronic switching systems; pipeline processing; pulse code modulation; synchronisation; teleconferencing; 0.7 micron; AGC algorithm; CMOS technology; NetConf; PCM channel processing; automatic gain control; digital switching systems; four-ports static RAMs; multiple frame synchronization timing; noise suppression; plastic DIL package; single chip PCM conference circuit; single chip VLSI; soft reset; three level attenuation; two-stage pipeline architecture; Attenuation; CMOS technology; Circuit noise; Noise level; Phase change materials; Pipelines; Plastic packaging; Switching systems; Timing; Very large scale integration;
Conference_Titel :
ASIC Conference and Exhibit, 1995., Proceedings of the Eighth Annual IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-2707-1
DOI :
10.1109/ASIC.1995.580712