Title :
Logic vs. current testing: an evaluation using CrossCheck Technology´s CM-iTest
Author_Institution :
Texas Instrum. Inc., Dallas, TX, USA
Abstract :
This paper examines the effectiveness of using the CrossCheck software tool CM-iTest to select high-fault coverage, robust test vectors for measuring IDDQ. In the experiments section of the paper data from 4 ASIC designs is presented which examines the defect detection of stuck-at fault (SAF) functional testing versus IDDQ current testing for varying degrees of SAF and transistor-level I DDQ fault coverages. The IDDQ current testing further compares the defect detection of using CrossCheck CM-iTest selected IDDQ vectors versus randomly selected and customer selected IDDQ vectors
Keywords :
application specific integrated circuits; automatic test software; fault diagnosis; integrated circuit testing; logic testing; ASIC; CM-iTest; CrossCheck Technology; IDDQ vectors; current testing; defect detection; logic testing; software tool; stuck-at fault functional testing; Application specific integrated circuits; Circuit faults; Circuit testing; Fault detection; Instruments; Integrated circuit modeling; Logic testing; Performance evaluation; Software measurement; Software tools;
Conference_Titel :
ASIC Conference and Exhibit, 1995., Proceedings of the Eighth Annual IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-2707-1
DOI :
10.1109/ASIC.1995.580716
