Title :
A fully integrated CMOS magnetic current monitor
Author :
Malcovati, Piero ; Maloberti, Franco
Author_Institution :
Dept. of Electr. Eng., Pavia Univ., Italy
Abstract :
In this paper we present a fully-integrated magnetic current monitor, which allows accurate and non-invasive current measurements in industrial apparatus. The magnetic field generated by the current to be measured is sensed by a Hall device, amplified, converted into the digital domain with 9 bits of resolution and delivered to an on-board I 2S serial interface. The voltage amplifier provides digitally programmable gain and offset. On-chip Zener-tapping circuits are used as PROM to store the gain and offset calibration words. Two different operating ranges (20 A and 200 A full scale) are available with independent calibration coefficients. A prototype of the complete microsystem has been integrated in a conventional 0.8 μm CMOS process. Experimental results are presented
Keywords :
CMOS integrated circuits; Hall effect transducers; calibration; electric current measurement; magnetic sensors; mixed analogue-digital integrated circuits; monitoring; 0.8 micron; 20 A; 200 A; 256 kHz; 5 V; ASIC; CMOS magnetic current monitor; Hall device; PROM; calibration words storage; digitally programmable gain; digitally programmable offset; fully-integrated current monitor; gain calibration words; independent calibration coefficients; industrial apparatus; noninvasive current measurements; offset calibration words; onboard I2S serial interface; onchip Zener-tapping circuits; voltage amplifier; CMOS process; Calibration; Current measurement; Integrated circuit measurements; Magnetic domains; Magnetic field measurement; Monitoring; PROM; Prototypes; Voltage;
Conference_Titel :
Circuits and Systems, 1999. ISCAS '99. Proceedings of the 1999 IEEE International Symposium on
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-5471-0
DOI :
10.1109/ISCAS.1999.777527
