DocumentCode
3414321
Title
Spatio-temporal phase-encoding profilometry using correlation image sensor
Author
Ando, Shigeru ; Ono, Nobutaka
Author_Institution
Dept. of Inf. Phys. & Comput., Univ. of Tokyo, Tokyo
fYear
2008
fDate
June 30 2008-July 2 2008
Firstpage
786
Lastpage
791
Abstract
In this paper, we propose a real-time 3D shape measurement system which consists of 1) a moving fringe projector for spatio-temporal encoding (single frequency in time but different phase in space) of illumination angle, and 2) the three-phase correlation image sensor (3PCIS) which performs the synchronous detection and amplitude/phase demodulation of intensity-modulated light in real time on each pixel. The 3PCIS demodulates amplitude and phase of moving fringes in a scene frame by frame. Then, it is unwrapped in real-time to a sequence of projection angle maps based on an efficient use of spatial and temporal continuity of the phase maps. Compared with the phase-shift method using a color image sensor or a high speed camera, the system is shown to have novel characteristics; pixel by pixel capture of phase map in a single frame, freedom from environmental light sources and grayness nonlinearity of fringes, reduced sensitivity to object motion, etc. We implemented this system using CMOS 200times200 and 320times256 pixel 3PCIS recently developed by us.
Keywords
amplitude modulation; correlation methods; image coding; image colour analysis; image sensors; optical projectors; phase modulation; real-time systems; shape measurement; 3D shape measurement system; amplitude/phase demodulation; color image sensor; intensity-modulated light; moving fringe projector; projection angle map; real-time system; spatio-temporal phase-encoding profilometry; synchronous detection; three-phase correlation image sensor; Extraterrestrial measurements; Frequency; Image coding; Image sensors; Lighting; Performance evaluation; Phase detection; Pixel; Real time systems; Shape measurement; 3-D measurement; correlation image sensor; moire; phase shift; phase unwrapping; quadrature detection;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics, 2008. ISIE 2008. IEEE International Symposium on
Conference_Location
Cambridge
Print_ISBN
978-1-4244-1665-3
Electronic_ISBN
978-1-4244-1666-0
Type
conf
DOI
10.1109/ISIE.2008.4677260
Filename
4677260
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