Title :
SURE-LET image deconvolution using multiple Wiener filters
Author :
Feng Xue ; Luisier, Florian ; Blu, T.
Author_Institution :
Dept. of Electron. Eng., Chinese Univ. of Hong Kong, Hong Kong, China
fDate :
Sept. 30 2012-Oct. 3 2012
Abstract :
We propose a novel deconvolution algorithm based on the minimization of Stein´s unbiased risk estimate (SURE). We linearly parametrize the deconvolution process by using multiple Wiener filterings as elementary functions, followed by undecimated Haar-wavelet thresholding. The key contributions of our approach are: 1) the linear combination of several Wiener filters with different (but fixed) regularization parameters, which avoids the manual adjustment of a single nonlinear parameter; 2) the use of linear parameterization, which makes the SURE minimization finally boil down to solving a linear system of equations, leading to a very fast and exact optimization of the whole deconvolution process. The results obtained on standard test images show that our algorithm favorably compares with the other state-of-the-art deconvolution methods in both speed and quality.
Keywords :
Haar transforms; Wiener filters; deconvolution; image segmentation; minimisation; wavelet transforms; SURE minimization; SURE-LET image deconvolution; Stein´s unbiased risk estimate minimization; deconvolution algorithm; elementary functions; exact optimization; fast optimization; linear parameterization; multiple Wiener filters; nonlinear parameter adjustment; regularization parameters; undecimated Haar-wavelet thresholding; Image restoration; PSNR; Tuning; Deconvolution; SURE minimization; Wiener filtering; linear parametrization; undecimated Haar wavelet thresholding;
Conference_Titel :
Image Processing (ICIP), 2012 19th IEEE International Conference on
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4673-2534-9
Electronic_ISBN :
1522-4880
DOI :
10.1109/ICIP.2012.6467540