Reduced-dimension and wavelet processing of SMD images for real-time inspection

Author

Gallegos, J. ; Villalobos, J.R. ; Carrillo, Gerardo ; Cabrera, Sergio D.

Author_Institution

Dept. of Electr. & Comput. Eng., Texas Univ., El Paso, TX, USA

fYear

1996

fDate

8-9 Apr 1996

Firstpage

30

Lastpage

36

Abstract

This paper presents a technique that uses a linear projection of images and other processing steps to arrive at a one-dimensional multiplierless correlation. This operation is used to detect the presence or absence of surface mounted devices (SMDs) in the inspection of printed circuit boards. Images with two types of illuminations are processed to produce two different decision schemes: one to detect component presence and the other to detect component absence. Additionally, the use of wavelet decomposition is examined as a pre-processing step in feature extraction, from which classification can be made

Keywords

automatic optical inspection; feature extraction; image classification; printed circuit testing; surface mount technology; wavelet transforms; SMD images; component absence detection; component presence detection; feature extraction; illuminations; image classification; linear image projection; one-dimensional multiplierless correlation; preprocessing step; printed circuit boards inspection; real-time inspection; reduced dimension processing; surface mounted devices; wavelet decomposition; wavelet processing; Assembly; Automatic optical inspection; Contracts; Educational technology; Feature extraction; Humans; Lighting; Manufacturing processes; Optical surface waves; Printed circuits;

fLanguage

English

Publisher

ieee

Conference_Titel

Image Analysis and Interpretation, 1996., Proceedings of the IEEE Southwest Symposium on

Conference_Location

San Antonio, TX

Print_ISBN

0-7803-3200-8

Type

conf

DOI

10.1109/IAI.1996.493722

Filename

493722