Title :
Multiple-Vdd multiple-Vth CMOS (MVCMOS) for low power applications
Author :
Roy, Kaushik ; Wei, Liqiong ; Chen, Zhanping
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
Abstract :
In this paper, multiple-Vdd and multiple-Vth design techniques are combined to simultaneously achieve high performance and low power. The transistors in critical path(s) are assigned a higher supply voltage and a lower threshold voltage for high performance, while the transistors in non-critical paths may have a lower supply voltage and/or a higher threshold voltage to suppress dynamic power and leakage power. Accurate delay and power estimates using table look-up methods based on HSPICE simulations are used for supply voltage and threshold voltage optimization. Several algorithms for Vdd and Vth assignments under performance constraints are proposed and a genetic algorithm based vector control technique is presented for standby leakage reduction. For the ISCAS benchmark circuits, multiple-Vdd, multiple-Vth CMOS (MVCMOS) design technique can reduce dynamic and leakage power dissipations by around 20% and 70%, respectively
Keywords :
CMOS integrated circuits; circuit CAD; circuit optimisation; circuit simulation; delay estimation; genetic algorithms; integrated circuit design; low-power electronics; table lookup; CMOS design technique; HSPICE simulations; critical paths; delay estimates; genetic algorithm based vector control technique; low power applications; multiple-Vdd design technique; multiple-Vth design technique; noncritical paths; performance constraints; power estimates; standby leakage reduction; supply voltage optimization; table lookup methods; threshold voltage optimization; Circuit simulation; Circuit synthesis; Delay estimation; Energy consumption; Genetic algorithms; Leakage current; Low voltage; Power dissipation; Propagation delay; Threshold voltage;
Conference_Titel :
Circuits and Systems, 1999. ISCAS '99. Proceedings of the 1999 IEEE International Symposium on
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-5471-0
DOI :
10.1109/ISCAS.1999.777879