Title :
Predicting the SEU error rate through fault injection for a complex microprocessor
Author :
Peronnard, P. ; Ecoffet, R. ; Pignol, M. ; Bellin, D. ; Velazco, R.
Author_Institution :
TIMA Lab., Grenoble
fDate :
June 30 2008-July 2 2008
Abstract :
This paper deals with the prediction of SEU error rate for an application running on a complex processor. Both, radiation ground testing and fault injection, were performed while the selected processor, a Power PC 7448, executed a software issued from a real space application. The predicted error rate shows that generally used strategies, based on static cross-section, significantly overestimate the application error rate.
Keywords :
fault simulation; integrated circuit testing; logic design; microprocessor chips; Power PC 7448; SEU error rate; complex microprocessor; fault injection; radiation ground testing; Application software; Circuit faults; Circuit testing; Communication system control; Error analysis; Field programmable gate arrays; Microprocessors; Performance evaluation; Single event upset; Software testing;
Conference_Titel :
Industrial Electronics, 2008. ISIE 2008. IEEE International Symposium on
Conference_Location :
Cambridge
Print_ISBN :
978-1-4244-1665-3
Electronic_ISBN :
978-1-4244-1666-0
DOI :
10.1109/ISIE.2008.4677290
