Mode Suppressed TEM Cell Design For High Frequency IC Measurements

Author

Deng, Shaowei ; Pommerenke, David ; Hubing, Todd ; Drewniak, James ; Beetner, Daryl ; Shin, Dongshik ; Kim, Sungnam ; Kwak, Hocheol

Author_Institution

Univ. of Missouri-Rolla, Rolla

fYear

2007

fDate

9-13 July 2007

Firstpage

1

Lastpage

6

Abstract

TEM cells or GTEM cells can be used to evaluate the radiated emissions of integrated circuits (ICs). The applicable frequency bandwidth of a TEM cell is limited due to the resonances of higher order modes. This paper describes how a TEM cell can be modified to extend the frequency range without changing the test topology. Several methods are proposed and implemented to suppress the higher order modes. The magnetic field coupling and electric field coupling are evaluated for the new design. The frequency bandwidth of the modified TEM cell is extended from original 1 GHz to 2. 5 GHz.

Keywords

TEM cells; electromagnetic compatibility; electromagnetic coupling; integrated circuit measurement; radiation effects; electric field coupling; electromagnetic compatibility; frequency bandwidth; high frequency IC measurements; integrated circuit radiated emissions; magnetic field coupling; mode suppressed TEM cell design; Bandwidth; Circuit testing; Cutoff frequency; Electromagnetic measurements; Frequency measurement; Magnetic fields; Resonance; Resonant frequency; TEM cells; Tellurium;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility, 2007. EMC 2007. IEEE International Symposium on

Conference_Location

Honolulu, HI

Print_ISBN

1-4244-1349-4

Electronic_ISBN

1-4244-1350-8

Type

conf

DOI

10.1109/ISEMC.2007.13

Filename

4305593