• DocumentCode
    3415870
  • Title

    Factor graph em algorithm for joint channel tracking and MAP detection of MIMO-OFDMA in fading channels

  • Author

    Wu, Sau-Hsuan

  • Author_Institution
    Dept. of Commun. Eng., Nat. Chiao Tung Univ., Hsinchu
  • fYear
    2008
  • fDate
    March 31 2008-April 4 2008
  • Firstpage
    2701
  • Lastpage
    2704
  • Abstract
    Based on the expectation maximization (EM) algorithm, a joint channel tracking and maximal a posteriori symbol detection method is proposed for orthogonal frequency division multiple access systems employing multiple transmit and receive antennas (MIMO). Using the Forney-style factor graph (FFG), a forward-and-backward signal processing method is developed to recursively solve the EM problem for joint estimation and detection (JED) in MIMO fading channels. By proper message scheduling and passing over the FFG, simulations show that the proposed algorithm is effective for joint MIMO channel tracking and symbol detection in fast fading channels.
  • Keywords
    MIMO communication; OFDM modulation; expectation-maximisation algorithm; fading channels; frequency division multiple access; receiving antennas; transmitting antennas; Forney-style factor graph; MAP detection; MIMO fading channels; MIMO-OFDMA; expectation maximization algorithm; factor graph EM algorithm; fast fading channels; forward-and-backward signal processing method; joint MIMO channel tracking; joint detection; joint estimation; maximal a posteriori symbol detection method; message passing; message scheduling; orthogonal frequency division multiple access systems; receive antennas; transmit antennas; Fading; Feedback; MIMO; Multiple access interference; OFDM; Receiving antennas; Recursive estimation; Scheduling algorithm; Signal processing algorithms; Transmitting antennas; EM; Factor Graph; Joint Estimation and Detection; MIMO; OFDM; OFDMA;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Acoustics, Speech and Signal Processing, 2008. ICASSP 2008. IEEE International Conference on
  • Conference_Location
    Las Vegas, NV
  • ISSN
    1520-6149
  • Print_ISBN
    978-1-4244-1483-3
  • Electronic_ISBN
    1520-6149
  • Type

    conf

  • DOI
    10.1109/ICASSP.2008.4518206
  • Filename
    4518206