• DocumentCode
    34159
  • Title

    Complete Modeling of Large Via Constellations in Multilayer Printed Circuit Boards

  • Author

    Muller, Sebastian ; Happ, Fabian ; Xiaomin Duan ; Rimolo-Donadio, Renato ; Bruns, Heinz-Dietrich ; Schuster, Christian

  • Author_Institution
    Inst. fur Theor. Elektrotechnik, Tech. Univ. Hamburg-Harburg (TUHH), Hamburg, Germany
  • Volume
    3
  • Issue
    3
  • fYear
    2013
  • fDate
    Mar-13
  • Firstpage
    489
  • Lastpage
    499
  • Abstract
    This paper presents, for the first time, the comprehensive modeling of complete via constellations consisting of several thousands of vias in multilayer printed circuit boards using the physics-based approach. For each computational step of the physics-based approach, several alternatives are analyzed with regard to their computational efficiency, and calculation times are discussed as a function of the number of simulated vias. The results of this analysis are used in combination with previous studies to determine an efficient yet accurate algorithm for the simulation of large numbers of vias. The impact of the stackup configuration on the computational effort of the algorithm is analyzed, and the most computationally expensive parts of the calculation process are identified. A parallelization of the algorithms is carried out to accelerate the critical calculation tasks. As an evaluation example, simulation results for a via array consisting of 10 000 vias and eight cavities are shown. With the proposed simulation methods, the computation time for this via array is about 6.5 h per frequency point on a single CPU and about 40 min per frequency point with the parallel version running on 16 CPUs.
  • Keywords
    printed circuits; algorithms parallelization; computational efficiency; large via constellation; multilayer printed circuit board; parallel version; physics-based approach; single CPU; stackup configuration; Capacitance; Cavity resonators; Computational modeling; Integrated circuit modeling; Ports (Computers); Scattering parameters; Transmission line matrix methods; Computational electromagnetics; equivalent circuit model; multilayer printed circuit board; through-hole via;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    2156-3950
  • Type

    jour

  • DOI
    10.1109/TCPMT.2012.2234211
  • Filename
    6423302