DocumentCode :
3415914
Title :
The thru-reflection-unequal-line (TRuL) calibration method for scattering matrix measurement of multi-port networks
Author :
Lu, Hsin-Chia ; Chou, Yien-Tien
Author_Institution :
Dept. of Electr. Eng., National Taiwan Univ., Taipei, Taiwan
Volume :
5
fYear :
2005
fDate :
4-7 Dec. 2005
Abstract :
The multimode TRL calibration method is known as an approach for the measurement of multi-conductor transmission line devices. The propagation constants of different modes propagating along the multi-conductor transmission line must be different using this method. However, in general multi-port networks, the propagating constants at each port may be equal. We here then present the thru-reflection-unequal-line (TRuL) calibration method for the calibration of the equal propagation constant case. Lines of unequal length are used to make the eigenvalues unequal during calibration process. This will greatly simplify the calculation. The measured scattering matrix of a branch line coupler on FR4 substrate using proposed calibration method shows good agreement with simulation. This method can also be extended for the calibration of on-wafer and multi-port networks.
Keywords :
S-matrix theory; S-parameters; calibration; eigenvalues and eigenfunctions; multiconductor transmission lines; multiport networks; FR4 substrate; branch line coupler; eigenvalues; multiconductor transmission line; multiport networks; on-wafer networks; propagation constants; scattering matrix; scattering parameters measurement; thru-reflection-unequal-line calibration method; Calibration; Eigenvalues and eigenfunctions; Electric variables measurement; Electronic mail; Multiconductor transmission lines; Propagation constant; Scattering; Transmission line matrix methods; Transmission line measurements; Transmission lines; calibration; multi-port network; scattering parameters measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference Proceedings, 2005. APMC 2005. Asia-Pacific Conference Proceedings
Print_ISBN :
0-7803-9433-X
Type :
conf
DOI :
10.1109/APMC.2005.1606996
Filename :
1606996
Link To Document :
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