DocumentCode :
3415918
Title :
Logistic Regression in Immunity Testing
Author :
Giunta, G. ; Audone, B.
fYear :
2007
fDate :
9-13 July 2007
Firstpage :
1
Lastpage :
6
Abstract :
Logistic Regression, a statistical analysis tool used for epidemiological studies, can be successfully exploited to interpret susceptibility test results with the twofold aim of understanding which are the most significant causes affecting the Device under Test (DUT) and of providing a technique to define a global figure of safety margin when many test parameters are involved. The background of Logistic Regression is briefly summarized and then a graphical interpretation of test results is provided. Finally, the experimental validation of the method is described.
Keywords :
circuit testing; electromagnetic compatibility; immunity testing; regression analysis; EMC; device under test; epidemiological study; immunity testing; logistic regression; safety margin; statistical analysis tool; Back; Electromagnetic compatibility; Immune system; Immunity testing; Linear regression; Logistics; Performance evaluation; Polarization; Safety devices; Statistical analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2007. EMC 2007. IEEE International Symposium on
Conference_Location :
Honolulu, HI
Print_ISBN :
1-4244-1349-4
Electronic_ISBN :
1-4244-1350-8
Type :
conf
DOI :
10.1109/ISEMC.2007.52
Filename :
4305632
Link To Document :
بازگشت