• DocumentCode
    3416079
  • Title

    Evaluating the relationship between user interaction and financial visual analysis

  • Author

    Jeong, Dong Hyun ; Dou, Wenwen ; Lipford, Heather Richter ; Stukes, Felesia ; Chang, Remco ; Ribarsky, William

  • fYear
    2008
  • fDate
    19-24 Oct. 2008
  • Firstpage
    83
  • Lastpage
    90
  • Abstract
    It has been widely accepted that interactive visualization techniques enable users to more effectively form hypotheses and identify areas for more detailed investigation. There have been numerous empirical user studies testing the effectiveness of specific visual analytical tools. However, there has been limited effort in connecting a userpsilas interaction with his reasoning for the purpose of extracting the relationship between the two. In this paper, we present an approach for capturing and analyzing user interactions in a financial visual analytical tool and describe an exploratory user study that examines these interaction strategies. To achieve this goal, we created two visual tools to analyze raw interaction data captured during the user session. The results of this study demonstrate one possible strategy for understanding the relationship between interaction and reasoning both operationally and strategically.
  • Keywords
    data visualisation; financial data processing; interactive systems; empirical user studies testing; financial visual analysis; interactive visualization technique; user interaction; user´s reasoning process; visual analytical tool; Data analysis; Data mining; Data visualization; Graphical user interfaces; Human computer interaction; Joining processes; Testing; User interfaces; Visual analytics; Wire; H.5.2 [Information Interfaces And Presentation (e.g., HCI)]: User Interfaces—Evaluation/methodology; H.5.2 [Information Interfaces And Presentation (e.g., HCI)]: User Interfaces—Graphical user interfaces (GUI);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Visual Analytics Science and Technology, 2008. VAST '08. IEEE Symposium on
  • Conference_Location
    Columbus, OH
  • Print_ISBN
    978-1-4244-2935-6
  • Type

    conf

  • DOI
    10.1109/VAST.2008.4677360
  • Filename
    4677360