Title :
Mapping geological faults using image processing techniques applied to hill-shaded digital elevation models
Author :
Henderson, Brent D. ; Ferrill, David A. ; Clarke, Keith C.
Author_Institution :
Centre for Nucl. Waste Regul. Anal., Southwest Res. Inst., San Antonio, TX, USA
Abstract :
Image processing techniques have previously been used to extract lineaments from aerial photographs and satellite images as a means for identifying linear surface traces of planar geologic structures such as faults and fractures. A major limitation of aerial photographs is their dependence on natural east-west solar illumination paths which highlight north-south linear features, perpendicular to the solar illumination. Hill-shaded digital elevation models (DEMs) are an alternative source for topographic imagery. The advantage of hill-shaded imagery is the freedom to select illumination from any angle. We present a procedure for extracting lineaments from hill-shaded DEMs and make comparisons of extracted lineaments to mapped faults from the Saline Range, California, and Yucca Mountain, Nevada. Results of these comparisons illustrate the effectiveness of extracting lineaments from hill-shaded DEMs
Keywords :
faulting; feature extraction; geodesy; geology; geophysical signal processing; geophysical techniques; remote sensing; topography (Earth); California; DEM; Nevada; Saline Range; Yucca Mountain; aerial photographs; artificial shadow; east-west solar illumination paths; fault identification; geological faults mapping; geophysical measurement technique; hill-shaded digital elevation models; image analysis; image processing techniques; image recognition; land surface topography; lineaments extraction; linear surface traces; north-south linear features; planar geologic structures; satellite images; tectonics; topographic imagery; Data mining; Digital elevation models; Feature extraction; Geology; Image analysis; Image processing; Lighting; Surface cracks; Surface topography; Vegetation mapping;
Conference_Titel :
Image Analysis and Interpretation, 1996., Proceedings of the IEEE Southwest Symposium on
Conference_Location :
San Antonio, TX
Print_ISBN :
0-7803-3200-8
DOI :
10.1109/IAI.1996.493760