• DocumentCode
    3416268
  • Title

    An ultra-small isolation area for 600V class reverse blocking IGBT with deep trench isolation process (TI-RB-IGBT)

  • Author

    Tokuda, Norifumi ; Kaneda, Mitsuru ; Minato, Tadaharu

  • Author_Institution
    power device works, Mitsubishi Electr. Corp., Fukuoka, Japan
  • fYear
    2004
  • fDate
    24-27 May 2004
  • Firstpage
    129
  • Lastpage
    132
  • Abstract
    We developed a 600 V class trench isolation RB-IGBT (TI-RB-IGBT), whose termination area is extremely small in comparison with other isolation techniques, such as diffusion isolation or silicon mesa etching. The TI area is not only very small but also almost identical for all the blocking voltage classes. Our fabricated 100 A class TI-RB-IGBT, with one micron rule planar gate structure, has more than 600 V blocking capability for both directions, and its trade-off relationship between the forward voltage drop Vce(sat) and the turn-off energy loss Eoff is slightly better than our previous punch through (PT) type third generation planar gated IGBT, even though it has an n-body and the backside collector structure is of the NPT type.
  • Keywords
    insulated gate bipolar transistors; isolation technology; power bipolar transistors; power field effect transistors; 100 A; 600 V; NPT type backside collector structure; TI-RB-IGBT termination area; bidirectional blocking capability; deep trench isolation process; forward voltage drop; planar gate structure; reverse blocking IGBT; turn-off energy loss; ultra-small isolation area; Insulated gate bipolar transistors; Isolation technology; Power FETs; Power bipolar transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices and ICs, 2004. Proceedings. ISPSD '04. The 16th International Symposium on
  • Print_ISBN
    4-88686-060-5
  • Type

    conf

  • DOI
    10.1109/ISPSD.2004.1332879
  • Filename
    1332879