• DocumentCode
    3416469
  • Title

    Multi-voltage SOI-BiCDMOS for 14V&42V automotive applications

  • Author

    Kawai, Fumiaki ; Onishi, Tom ; Kamiya, Takumi ; Ishimabushi, Hisashi ; Eguchi, Hiroomi ; Nakaharna ; Aoki, Hirofumi ; Hamada, Kimimori

  • Author_Institution
    Toyota Motor Corp., Aichi, Japan
  • fYear
    2004
  • fDate
    24-27 May 2004
  • Firstpage
    165
  • Lastpage
    168
  • Abstract
    This paper presents a new multi-voltage SOI-BiCDMOS, which particularly focuses on "power MOSFET and BJT rich automotive applications". This technology can integrate Nch LDMOS and Pch LDMOS which have 35 V/60 V/80 V breakdown voltages, high packing density deep trench isolated BJTs, and a low cost 0.8 μm CMOS, on a single chip. The six types of LDMOS can be simultaneously fabricated with only two additional masks to a CMOS process, and these LDMOSs satisfy both low specific on-resistance and good SOA. Furthermore, in this technology, a bonded SOI wafer with 200 mm diameter has been newly adopted in order to reduce chip cost.
  • Keywords
    BiCMOS integrated circuits; automotive electronics; isolation technology; power MOSFET; power bipolar transistors; power integrated circuits; semiconductor device breakdown; silicon-on-insulator; 0.8 micron; 14 V; 200 mm; 35 V; 42 V; 60 V; 80 V; CMOS; N-channel LDMOS on-resistance; P-channel LDMOS; SOA; automotive IC; bonded SOI wafer; high packing density deep trench isolation; multiple-voltage SOI-BiCDMOS; power BJT; power MOSFET breakdown voltage; BiCMOS integrated circuits; Isolation technology; Power MOSFETs; Power bipolar transistors; Power integrated circuits; Road vehicle electronics; Silicon on insulator technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices and ICs, 2004. Proceedings. ISPSD '04. The 16th International Symposium on
  • Print_ISBN
    4-88686-060-5
  • Type

    conf

  • DOI
    10.1109/ISPSD.2004.1332891
  • Filename
    1332891