Title :
The Solutions of LCD Panel (T-Con) EMI Noise for Wireless Integration
Author :
Lee, Sung-Kyu ; Lim, Jung-Man ; Lee, Ki-Seob ; Choi, On-sik ; Lee, Bae-Won ; Kim, Do-Wan ; Hayakawa, Masashi ; Kami, Yoshio
Author_Institution :
SAMSUNG Electron. Co.,Ltd., Yongin
Abstract :
Electromagnetic interference (EMI) from a LCD panel deteriorates the performance of wireless network system (including Wireless network cards: Wireless Local Area Network (WLAN) card and Wireless Wide Area Network (WWAN) card) in a notebook. One of the main EMI noise source for the wireless network system in a liquid crystal display (LCD) panel is the timing controller IC (T-Con). In this paper, the approach to solve the problems of EMI noise in T- Con of LCD panel and the method of measuring the EMI noise of the T-Con itself by using the TEM-cell are introduced. Secondly, the solutions with the use of TEM cell tests, signal analyses etc are suggested to improve the EMI noise of the T- Con. Finally, the measurement results of the EMI noise level of the LCD panel (with the improved T-Con through these approaches) are presented. Because the EMI noise problem becomes more and more important issues for the wireless network systems, the solutions of the problem and proper proposals have to be studied, which are suggested in this paper. All of the solutions were verified experimentally.
Keywords :
TEM cells; electromagnetic interference; liquid crystal displays; network interfaces; noise measurement; notebook computers; wireless LAN; EMI noise measurement; LCD panel T- Con; TEM-cell; WLAN system; electromagnetic interference; liquid crystal display; notebook system; timing controller IC; wireless network system; Control systems; Electromagnetic interference; Integrated circuit noise; Liquid crystal displays; Noise measurement; TEM cells; Timing; Wide area networks; Wireless LAN; Wireless networks;
Conference_Titel :
Electromagnetic Compatibility, 2007. EMC 2007. IEEE International Symposium on
Conference_Location :
Honolulu, HI
Print_ISBN :
1-4244-1349-4
Electronic_ISBN :
1-4244-1350-8
DOI :
10.1109/ISEMC.2007.85