• DocumentCode
    3416689
  • Title

    Load Current Funneling Examination for Power Distribution in High Performance Multi-Core Silicon Devices

  • Author

    DiBene, Ted J., II

  • Author_Institution
    Intel Corp., Dupont
  • fYear
    2007
  • fDate
    9-13 July 2007
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Powering silicon devices today is challenging due to the increasing concentration of current into the load at the silicon. As multi-core processing becomes more available larger numbers of computational units are placed on a single piece of silicon allowing more processing and higher bandwidth in our computer systems. However, as the devices become smaller, the current density also increases which raises some fundamental questions on the impacts at the interconnect level and the performance of the power distribution network in general. This paper discusses the issue of current funneling into high density devices particularly around the advent of multi-core processing and discusses some of the issues and effects one may see as the technology moves forward into the future.
  • Keywords
    microprocessor chips; multiprocessing systems; computer systems; load current funneling examination; multicore processing; multicore silicon devices; power distribution network; Clocks; Current distribution; Frequency; Microprocessors; Multicore processing; Packaging; Power distribution; Power systems; Silicon devices; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2007. EMC 2007. IEEE International Symposium on
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    1-4244-1349-4
  • Electronic_ISBN
    1-4244-1350-8
  • Type

    conf

  • DOI
    10.1109/ISEMC.2007.97
  • Filename
    4305677