DocumentCode :
3416704
Title :
Trench gate power MOSFETs with retrograde body profile
Author :
Tsui, Bing-Yue ; Wu, Mmg-Da ; Gan, Tian-Choy ; Chou, Hui-Hua ; Wu, Zhi-Liang ; Sune, Ching-Tzong
Author_Institution :
Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
fYear :
2004
fDate :
24-27 May 2004
Firstpage :
213
Lastpage :
216
Abstract :
Low specific on-resistance (Rds,on) and low gate capacitance are essential for trench gate power MOSFETs. In this work, we propose a simple method of retrograde body profile to improve the two parameters simultaneously. The retrograde body MOSFET (RBMOS) is realized by high energy implantation. Because the highest channel concentration is located close to the drain side, the depletion width at the drain side is suppressed, so that the channel length can be shortened greatly without sacrificing punch-through voltage. A low thermal budget and easy trench gate process are additional benefits. A power MOSFET with channel length of 0.4 μm, threshold voltage of 1 V, and breakdown voltage of 32 V is demonstrated. Compared with the conventional device, the specific on-resistance and the figure-of-merit can be improved by 38% and 70%, respectively.
Keywords :
doping profiles; ion implantation; power MOSFET; semiconductor device breakdown; 0.4 micron; 1 V; 32 V; RBMOS; breakdown voltage; channel length shortening; doping profile; drain side channel doping concentration; drain side depletion width; figure-of-merit; high energy ion-implantation; low gate capacitance; low specific on-resistance; low thermal budget; punch-through voltage; retrograde body profile MOSFET; threshold voltage; trench gate power MOSFET; trench gate process; Ion implantation; Power MOSFETs;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Semiconductor Devices and ICs, 2004. Proceedings. ISPSD '04. The 16th International Symposium on
Print_ISBN :
4-88686-060-5
Type :
conf
DOI :
10.1109/ISPSD.2004.1332903
Filename :
1332903
Link To Document :
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