Title :
Growth of high quality SnS van der Waals epitaxies on graphene buffer layer for photovoltaic applications
Author :
Wang, W. ; Leung, Kin K. ; Fong, W.K. ; Wang, S.F. ; Hui, Y.Y. ; Lau, S.P. ; Surya, Charles
Author_Institution :
Dept. of Electron. & Inf. Eng., Hong Kong Polytech. Univ., Hong Kong, China
fDate :
Oct. 29 2012-Nov. 1 2012
Abstract :
SnS van der Waals epitaxies (vdWEs) were grown by molecular beam epitaxy (MBE) on graphene buffer layer. Photo-absorption measurements indicate an indirect bandgap of ~1 eV and a direct bandgap of ~1.25 e V. Using this novel growth technique we observed significant lowering in the crystal size and the rocking curve FWHM compared to films deposited without the buffer layer. The absorption coefficient, α, is of the order of 104cm-1 with sharp cutoff in energy indicating low concentration of bandgap states. Hole mobility as high as 81 cm2V-1s-1 was observed for SnS films on graphene/GaAs(100) substrates. The layered structure and chemically saturated bonds for SnS and the graphene buffer layer stipulate that the interaction at the interface is dominated by vdW force. This significantly enhances the tolerance in the lattice mismatch leading the improvement in the crystallinity of the film.
Keywords :
absorption coefficients; energy gap; hole mobility; molecular beam epitaxial growth; photoexcitation; semiconductor epitaxial layers; semiconductor growth; tin compounds; van der Waals forces; wide band gap semiconductors; C-GaAs; MBE; SnS; absorption coefficient; band gap states; chemically saturated bonds; crystal size; crystallinity; direct band gap; graphene buffer layer; graphene-GaAs(100) substrates; high quality SnS van der Waals epitaxy; hole mobility; indirect band gap; lattice mismatch; layered structure; molecular beam epitaxy; photoabsorption measurements; photovoltaic applications; rocking curve FWHM; Buffer layers; Gallium arsenide; Graphene; Lattices; Photonic band gap; Substrates;
Conference_Titel :
Solid-State and Integrated Circuit Technology (ICSICT), 2012 IEEE 11th International Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-1-4673-2474-8
DOI :
10.1109/ICSICT.2012.6467666