• DocumentCode
    3416855
  • Title

    Uncertainty Analysis and Novel Test Procedures Performed with a Realtime Time-Domain EMI Measurement System

  • Author

    Braun, Stephan ; Russer, Peter

  • Author_Institution
    Tech. Univ. Munchen, Munich
  • fYear
    2007
  • fDate
    9-13 July 2007
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Time-domain EMI Measurement Systems allow to reduce the measurement time by several orders of magnitude. In this paper novel test procedures for radiated emission measurements based on a realtime time-domain emi measurement system are presented. Those test procedures take advantage of the parallel calculation of the spectrum at several thousand frequency bins. By a full maximization procedure full automated measurements can be performed. By an enhanced pre- and final scan a test procedure is presented that reduces test time by at least one order of magnitude. The proposed test reduces the critical parameters that have to be selected by the operator. Measurements have been performed in the frequency range 30 MHz - 1 GHz and compared with the results obtained by an EMI receiver. The long term stability of the emission of a brush motor is investigated. A measurement uncertainty analysis based on a reliable statistic of 200000 quasipeak values. The standard deviation as well as the histogram of the probability density function is calculated and evaluated.
  • Keywords
    electromagnetic interference; measurement uncertainty; probability; EMI receiver; automated measurements; brush motor; frequency 30 MHz to 1 GHz; measurement uncertainty analysis; probability density function; radiated emission measurements; realtime time-domain EMI measurement system; Brushes; Electromagnetic interference; Frequency measurement; Measurement uncertainty; Performance analysis; Performance evaluation; Stability; System testing; Time domain analysis; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2007. EMC 2007. IEEE International Symposium on
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    1-4244-1349-4
  • Electronic_ISBN
    1-4244-1350-8
  • Type

    conf

  • DOI
    10.1109/ISEMC.2007.104
  • Filename
    4305684