Title :
Test Techniques and Trade-offs for Embedded Cores and Systems
Author :
Parekhji, Rubin A.
Author_Institution :
Texas Instruments (India) Ltd.
Keywords :
Automatic testing; Automation; Costs; Digital signal processing; Instruments; System testing; Very large scale integration;
Conference_Titel :
VLSI Design, 2000. Thirteenth International Conference on
Print_ISBN :
0-7695-0487-6
DOI :
10.1109/ICVD.2000.812572
