DocumentCode
3416892
Title
A novel thick film on ceramic MCM technology offering MCM-D performance
Author
Barnwell, Dr Peter ; Wood, Jim
Author_Institution
Cermalloy Div., Heraeus Inc., West Conshohocken, PA, USA
fYear
1997
fDate
2-4 Apr 1997
Firstpage
48
Lastpage
52
Abstract
The majority of MCM circuits fall into one of three main categories: MCM-D offering high performance at high cost; MCM-C offering restricted performance at lower cost; MCM-L offering restricted performance at lowest cost. Thick film technology has been used relatively little due to its performance limitations with regard to geometrical constraints and poor material performance for high speed applications. This paper describes and discusses the performance of MCM structures fabricated using an advanced thick film conductor and dielectric technology on standard ceramic substrates. The resulting MCMs offer performance similar to MCM-D, with significant cost benefits. Line widths better than 25 microns and via geometries better than 50 microns resulting from a combination of novel materials and processing, give excellent geometrical properties. The novel dielectric material provides a dielectric constant of less than 4, with a loss factor better than 1×10-4. The paper concentrates on the performance of the technology, but also discusses the technology and its processing. In particular, the ability of the technology to generate MCM structures operating at microwave frequencies is illustrated
Keywords
ceramics; losses; multichip modules; permittivity; thick film devices; 25 to 50 micron; dielectric constant; dielectric technology; geometrical constraints; geometrical properties; high speed applications; line widths; loss factor; microwave frequencies; thick film conductor; thick film on ceramic MCM technology; via geometries; Ceramics; Circuits; Conducting materials; Conductive films; Costs; Dielectric films; Dielectric materials; Dielectric substrates; Paper technology; Thick films;
fLanguage
English
Publisher
ieee
Conference_Titel
Multichip Modules, 1997., International Conference on
Conference_Location
Denver, CO
Print_ISBN
0-7803-3787-5
Type
conf
DOI
10.1109/ICMCM.1997.581145
Filename
581145
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