Title :
New Validation and Test Problems for High Performance Deep Sub-micron VLSI Circuits
Author :
Breuer, Melvin A. ; Gupta, Sandeep K.
Keywords :
CMOS technology; Circuit noise; Circuit testing; Computer science; Crosstalk; Design automation; Digital systems; Switches; System testing; Very large scale integration;
Conference_Titel :
VLSI Design, 2000. Thirteenth International Conference on
Print_ISBN :
0-7695-0487-6
DOI :
10.1109/ICVD.2000.812575
