DocumentCode
3416975
Title
Surface Laminar Circuit (TM) carrier and flip chip assembly enabling technologies for advanced computer applications
Author
Jimarez, Miguel
Author_Institution
Microelectron. Div., IBM Corp., Endicott, NY, USA
fYear
1997
fDate
2-4 Apr 1997
Firstpage
70
Lastpage
74
Abstract
The current semiconductor industry association (SLA) roadmap shows that by the year 2000, chips with sizes up to 400 mm2 and chip pad counts (for package interconnection) will approach 2600 bumps. These requirements are necessary in order to keep up with continuing demand for faster on-chip clock rates and faster access to CACHE memory. IBM has been practising Flip Chip (FC) Controlled Collapse Chip Connection (C4) to ceramic substrates for over 30 years. Over the past 10 years IBM has developed a low cost printed wiring board (PWB) alternative, Surface Laminar Circuit (TM). This technology combined with FC, will allow IBM to meet the SIA requirements. This work presents an advanced MCM-L test vehicle (TV) that makes use of both Surface Laminar Circuit (TM) and FC to demonstrate feasibility of interconnecting 20×20 mm large chips and C4 bump counts up to 2400. This work focuses on the design of the carrier, some of the assembly challenges encountered and selected reliability results
Keywords
circuit reliability; flip-chip devices; microassembling; multichip modules; C4 bump count; IBM; MCM-L test vehicle; Surface Laminar Circuit carrier; advanced computer applications; carrier design; ceramic substrates; controlled collapse chip connection; flip chip assembly; reliability; Assembly; Cache memory; Ceramics; Circuit testing; Clocks; Electronics industry; Flip chip; Integrated circuit interconnections; Semiconductor device packaging; Substrates;
fLanguage
English
Publisher
ieee
Conference_Titel
Multichip Modules, 1997., International Conference on
Conference_Location
Denver, CO
Print_ISBN
0-7803-3787-5
Type
conf
DOI
10.1109/ICMCM.1997.581150
Filename
581150
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