DocumentCode :
3417042
Title :
3D parallel full band ensemble Monte Carlo devices simulation for nano scale devices application
Author :
Xiaoyan Liu ; Kangliang Wei ; Gang Du ; Wei Zhang ; Pingwen Zhang
Author_Institution :
Inst. of Microelectron., Peking Univ., Beijing, China
fYear :
2012
fDate :
Oct. 29 2012-Nov. 1 2012
Firstpage :
1
Lastpage :
4
Abstract :
A 3D parallel full band ensemble Monte Carlo device simulator is developed for simulation of nano scale semiconductor devices especially for the non planar structures. The transition rates for the various scattering processes including phonon scattering, ionized impurity scattering, remote Coulomb scattering, surface roughness scattering and surface phonon scattering are calculated based on Fermi´s golden rule. The quantum effect, quantum correction has been included using the effective potential (EP) method. 3D Poisson equation with non uniform hexahedron grid is solved self-consistently after the carriers´ free flight and scattering. We parallelize the 3D MC device simulator by utilizing the Trillions software package.
Keywords :
Coulomb blockade; Monte Carlo methods; Poisson equation; nanoelectronics; semiconductor devices; surface roughness; 3D Poisson equation; 3D parallel full band ensemble Monte Carlo devices; Fermi golden rule; Trillions software package; carriers free flight; effective potential method; ionized impurity scattering; nanoscale semiconductor devices; nonplanar structures; nonuniform hexahedron grid; quantum correction; quantum effect; remote Coulomb scattering; scattering process; surface phonon scattering; surface roughness scattering; transition rates; MOSFET circuits; Phonons; Rough surfaces; Scattering; Silicon; Solid modeling; Surface roughness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated Circuit Technology (ICSICT), 2012 IEEE 11th International Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-1-4673-2474-8
Type :
conf
DOI :
10.1109/ICSICT.2012.6467681
Filename :
6467681
Link To Document :
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