DocumentCode
3417124
Title
Performance and functional verification of microprocessors
Author
Bose, Pradip ; Abraham, Jacob A.
Author_Institution
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
fYear
2000
fDate
2000
Firstpage
58
Lastpage
63
Abstract
We address the problem of verifying the correctness of pre-silicon models of a microprocessor. We touch on the latest advances in this area by considering two different aspects of the validation problem: (a) verifying the functional integrity of the model and (b) testing the model for timing accuracy at the architectural level. The latter area, that of performance verification, is of increasing importance in the design of server-class processor chips, with one or more high performance cores on a single die. We show how simulation-based test cases can be generated under a unified defect and coverage model to detect both performance and functional bugs. We present and discuss examples of such integrated validation methodologies used in real processor development projects
Keywords
integrated circuit design; microprocessor chips; performance evaluation; timing; architectural level; defect and coverage model; functional integrity; functional verification; high performance cores; integrated validation methodologies; performance verification; pre-silicon models; processor development projects; server-class processor chips; simulation-based test cases; timing accuracy; validation problem; Accuracy; Computational modeling; Computer bugs; Costs; Design methodology; Manuals; Microprocessors; Process design; Testing; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design, 2000. Thirteenth International Conference on
Conference_Location
Calcutta
ISSN
1063-9667
Print_ISBN
0-7695-0487-6
Type
conf
DOI
10.1109/ICVD.2000.812585
Filename
812585
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