Title :
Performance and functional verification of microprocessors
Author :
Bose, Pradip ; Abraham, Jacob A.
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
Abstract :
We address the problem of verifying the correctness of pre-silicon models of a microprocessor. We touch on the latest advances in this area by considering two different aspects of the validation problem: (a) verifying the functional integrity of the model and (b) testing the model for timing accuracy at the architectural level. The latter area, that of performance verification, is of increasing importance in the design of server-class processor chips, with one or more high performance cores on a single die. We show how simulation-based test cases can be generated under a unified defect and coverage model to detect both performance and functional bugs. We present and discuss examples of such integrated validation methodologies used in real processor development projects
Keywords :
integrated circuit design; microprocessor chips; performance evaluation; timing; architectural level; defect and coverage model; functional integrity; functional verification; high performance cores; integrated validation methodologies; performance verification; pre-silicon models; processor development projects; server-class processor chips; simulation-based test cases; timing accuracy; validation problem; Accuracy; Computational modeling; Computer bugs; Costs; Design methodology; Manuals; Microprocessors; Process design; Testing; Timing;
Conference_Titel :
VLSI Design, 2000. Thirteenth International Conference on
Conference_Location :
Calcutta
Print_ISBN :
0-7695-0487-6
DOI :
10.1109/ICVD.2000.812585
