• DocumentCode
    3417124
  • Title

    Performance and functional verification of microprocessors

  • Author

    Bose, Pradip ; Abraham, Jacob A.

  • Author_Institution
    IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    58
  • Lastpage
    63
  • Abstract
    We address the problem of verifying the correctness of pre-silicon models of a microprocessor. We touch on the latest advances in this area by considering two different aspects of the validation problem: (a) verifying the functional integrity of the model and (b) testing the model for timing accuracy at the architectural level. The latter area, that of performance verification, is of increasing importance in the design of server-class processor chips, with one or more high performance cores on a single die. We show how simulation-based test cases can be generated under a unified defect and coverage model to detect both performance and functional bugs. We present and discuss examples of such integrated validation methodologies used in real processor development projects
  • Keywords
    integrated circuit design; microprocessor chips; performance evaluation; timing; architectural level; defect and coverage model; functional integrity; functional verification; high performance cores; integrated validation methodologies; performance verification; pre-silicon models; processor development projects; server-class processor chips; simulation-based test cases; timing accuracy; validation problem; Accuracy; Computational modeling; Computer bugs; Costs; Design methodology; Manuals; Microprocessors; Process design; Testing; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 2000. Thirteenth International Conference on
  • Conference_Location
    Calcutta
  • ISSN
    1063-9667
  • Print_ISBN
    0-7695-0487-6
  • Type

    conf

  • DOI
    10.1109/ICVD.2000.812585
  • Filename
    812585