DocumentCode :
3417137
Title :
Stud-bump bonding technique onto an advanced organic substrate for MCM-Ls
Author :
Shiraishi, Tsukasa ; Amami, Kazuyoshi ; Yuhaku, Satoru ; Bessho, Yoshiriro ; Eda, Kazuo ; Ishida, Toru
Author_Institution :
Matsushita Electr. Ind. Co. Ltd., Osaka, Japan
fYear :
1997
fDate :
2-4 Apr 1997
Firstpage :
109
Lastpage :
114
Abstract :
This paper describes the result of our study that bare LSI chips are mounted directly onto the “ALIVHTM” (any layer inner via hole) substrate by using Stud-Bump-Bonding (SBBTM ) technique, which has been developed by us. The SBBTM technique is an advanced flip-chip bonding technique, for high density Multi-Chip-Modules (MCMs), which can mount bare LSI chips directly onto substrates. The structure of the bonding portion is composed of Au bumps having two-stepped construction and conductive adhesives. The conductive adhesive is very flexible in bond, thus relaxing thermal and mechanical stresses. The ALIVHTM substrate has been developed in our laboratory. It is a high density and high performance multi-layered printed wiring board with any layer inner via hole structure, via hole processing technology using a CO2 laser and interconnection technology that employs conductive paste. We had good results for several reliability tests in the test vehicles of MCM-ALIVHTM. Especially, in the thermal shock test, the increase of connecting resistance in MCM-ALIVHTM was smaller than that of MCM-Ls which used ordinary organic substrates in stead of the ALIVHTM substrate. The combination of SBBTM technique and the ALIVHTM substrate is promising for miniaturized, light-weighted, high speed (high frequency), and high quality in MCMs
Keywords :
adhesion; flip-chip devices; integrated circuit packaging; large scale integration; multichip modules; organic compounds; substrates; ALIVH; Au; CO2 laser processing; LSI chip; MCM-L; any layer inner via hole; conductive adhesive; flip-chip bonding; interconnection technology; multi-chip module; multi-layered printed wiring board; organic substrate; reliability; stud-bump bonding; thermal shock testing; Bonding; Conductive adhesives; Gold; Laboratories; Large scale integration; Testing; Thermal conductivity; Thermal resistance; Thermal stresses; Wiring;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Multichip Modules, 1997., International Conference on
Conference_Location :
Denver, CO
Print_ISBN :
0-7803-3787-5
Type :
conf
DOI :
10.1109/ICMCM.1997.581157
Filename :
581157
Link To Document :
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