Title :
Research on testing method for quiescent current of automotive electronic devices
Author :
Jiang Yicheng ; Zhang Bowei
Author_Institution :
Res. Inst. of Electron. Eng. Technol., Harbin Inst. of Technol., Harbin, China
Abstract :
Quiescent current is a key technical parameter for automotive electronic devices. Currently there are few researches on testing method for quiescent current from domestic automobile manufacturers. With actual demand from domestic automobile manufacturers, a testing method for quiescent current of automotive electronic devices is proposed in this paper. Current data of each electronic device are acquired by voltage measurement with a measurement instrument. The testing system is established with the measurement instrument and the testing software, which is developed to cooperate with the instrument. The software can be used to acquire, decode, display and analyze the test data automatically in real time, and generate evaluation report. The testing system fulfills the requirement of quiescent current test and is proven effective in field test.
Keywords :
automobile industry; automotive electronics; test equipment; voltage measurement; automotive electronic devices; domestic automobile manufacturers; measurement instrument; quiescent current; testing method; testing software; testing system; voltage measurement; Automobiles; Automotive engineering; Current measurement; Instruments; Resistors; automotive electronics; data acquisition; quiescent current; testing method;
Conference_Titel :
Computer Science and Information Processing (CSIP), 2012 International Conference on
Conference_Location :
Xi´an, Shaanxi
Print_ISBN :
978-1-4673-1410-7
DOI :
10.1109/CSIP.2012.6308978