• DocumentCode
    3417430
  • Title

    Manufacturing and test considerations in system-on-chip designs

  • Author

    d´Abreu, M.

  • Author_Institution
    Level One Commun. Inc., Sacramento, CA, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    176
  • Lastpage
    177
  • Abstract
    In order to take costs into account, there needs to be proper cost models at every stage in the design cycle. These cost models must be able to compute SoC cost in terms of design characteristics that are available at the given design stage. This session describes the impact of cost at four stages in the design cycle: (a) architecture; (b) synthesis; (c) layout; and (d) test. This will be done using data from example industrial SoCs. In addition, methodologies to reduce costs at each of these three stages will be proposed
  • Keywords
    VLSI; application specific integrated circuits; integrated circuit design; integrated circuit manufacture; integrated circuit testing; cost models; design characteristics; design cycle; industrial SoCs; layout; system-on-chip designs; test; test considerations; Acceleration; Application specific integrated circuits; Clocks; Costs; Design for manufacture; Graphics; Manufacturing; Radio frequency; System testing; System-on-a-chip;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 2000. Thirteenth International Conference on
  • Conference_Location
    Calcutta
  • ISSN
    1063-9667
  • Print_ISBN
    0-7695-0487-6
  • Type

    conf

  • DOI
    10.1109/ICVD.2000.812605
  • Filename
    812605