DocumentCode
3417430
Title
Manufacturing and test considerations in system-on-chip designs
Author
d´Abreu, M.
Author_Institution
Level One Commun. Inc., Sacramento, CA, USA
fYear
2000
fDate
2000
Firstpage
176
Lastpage
177
Abstract
In order to take costs into account, there needs to be proper cost models at every stage in the design cycle. These cost models must be able to compute SoC cost in terms of design characteristics that are available at the given design stage. This session describes the impact of cost at four stages in the design cycle: (a) architecture; (b) synthesis; (c) layout; and (d) test. This will be done using data from example industrial SoCs. In addition, methodologies to reduce costs at each of these three stages will be proposed
Keywords
VLSI; application specific integrated circuits; integrated circuit design; integrated circuit manufacture; integrated circuit testing; cost models; design characteristics; design cycle; industrial SoCs; layout; system-on-chip designs; test; test considerations; Acceleration; Application specific integrated circuits; Clocks; Costs; Design for manufacture; Graphics; Manufacturing; Radio frequency; System testing; System-on-a-chip;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design, 2000. Thirteenth International Conference on
Conference_Location
Calcutta
ISSN
1063-9667
Print_ISBN
0-7695-0487-6
Type
conf
DOI
10.1109/ICVD.2000.812605
Filename
812605
Link To Document