Electromagnetic Field Distribution Measurements Using an Optically Scanning Probe System

Author

Takahashi, Masanori ; Kawasaki, Katsumi ; Ohba, Hiroyuki ; Ota, Hiroyasu ; Orikasa, Tatsuru ; Ishiyama, Kazushi ; Adachi, Nobuyasu ; Arai, Ken Ichi

Author_Institution

Nat. Inst. of Inf. & Commun. Technol., Sendai

fYear

2007

fDate

9-13 July 2007

Firstpage

1

Lastpage

6

Abstract

An optically scanning electromagnetic field probe system, consisting of an electro-optic or magneto-optic crystal substrate and a galvano scanner, has been developed for high speed, low-invasive measurement of electromagnetic field distribution. We present some examples of measurement of electric field distributions using a LiNbO₃ crystal substrate and the probe system. We have also measured magnetic field distributions above an MSL using a magnetic garnet thin film in the gigahertz range.

Keywords

crystals; electro-optical devices; electromagnetic fields; field strength measurement; magnetic thin films; magneto-optical devices; optical scanners; probes; electric field distributions; electro-optic crystal substrate; electromagnetic field distribution measurements; galvano scanner; magnetic field distributions; magnetic garnet thin film; magneto-optic crystal substrate; optically scanning probe system; Electric variables measurement; Electromagnetic fields; Electromagnetic measurements; Garnet films; High speed optical techniques; Magnetic field measurement; Optical films; Probes; Substrates; Velocity measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility, 2007. EMC 2007. IEEE International Symposium on

Conference_Location

Honolulu, HI

Print_ISBN

1-4244-1349-4

Electronic_ISBN

1-4244-1350-8

Type

conf

DOI

10.1109/ISEMC.2007.139

Filename

4305719