Title :
Electromagnetic Field Distribution Measurements Using an Optically Scanning Probe System
Author :
Takahashi, Masanori ; Kawasaki, Katsumi ; Ohba, Hiroyuki ; Ota, Hiroyasu ; Orikasa, Tatsuru ; Ishiyama, Kazushi ; Adachi, Nobuyasu ; Arai, Ken Ichi
Author_Institution :
Nat. Inst. of Inf. & Commun. Technol., Sendai
Abstract :
An optically scanning electromagnetic field probe system, consisting of an electro-optic or magneto-optic crystal substrate and a galvano scanner, has been developed for high speed, low-invasive measurement of electromagnetic field distribution. We present some examples of measurement of electric field distributions using a LiNbO3 crystal substrate and the probe system. We have also measured magnetic field distributions above an MSL using a magnetic garnet thin film in the gigahertz range.
Keywords :
crystals; electro-optical devices; electromagnetic fields; field strength measurement; magnetic thin films; magneto-optical devices; optical scanners; probes; electric field distributions; electro-optic crystal substrate; electromagnetic field distribution measurements; galvano scanner; magnetic field distributions; magnetic garnet thin film; magneto-optic crystal substrate; optically scanning probe system; Electric variables measurement; Electromagnetic fields; Electromagnetic measurements; Garnet films; High speed optical techniques; Magnetic field measurement; Optical films; Probes; Substrates; Velocity measurement;
Conference_Titel :
Electromagnetic Compatibility, 2007. EMC 2007. IEEE International Symposium on
Conference_Location :
Honolulu, HI
Print_ISBN :
1-4244-1349-4
Electronic_ISBN :
1-4244-1350-8
DOI :
10.1109/ISEMC.2007.139
