DocumentCode :
3417509
Title :
Statistical process control applied to automated dispense of silver filled epoxy for commercial millimeter wave multi chip module
Author :
Spinazzola, Robert
Author_Institution :
Procss Technol. Group, AMP Co., Lowell, MA, USA
fYear :
1997
fDate :
2-4 Apr 1997
Firstpage :
228
Lastpage :
233
Abstract :
This paper presents the results of continuous improvement from: Designed Experiments, Viscosity measurements, Statistical Process Control, documented operating procedures, and operator training and certification; on the automated epoxy dispense process. This capability enables the company; M/A-COM, to produce the first volume low cost 28 GHz Commercial Millimeter Wave Multi Chip Module Receiver. The Millimeter Wave Multi Chip Module Receiver uses GaAs Phempts measuring 12 by 10 mil length and width by 5 mil thick. This small discrete device required the development of a process for a ten mil diameter silver paste epoxy dot: repeatable, in production, and in volume. Statistically Designed Experiments were used to identify and set the most important process parameters. Viscosity measurements were made which characterized the silver filled epoxy paste. The ASTM methods for measuring viscosity of adhesives were modified to identify the material´s sensitivity to shear. A unique Statistical Process Control method was implemented to establish process control over a material which has proven to change flow behavior during processing through an auger type positive displacement pump. The key to the success of this project has been properly train operators
Keywords :
design of experiments; filled polymers; integrated circuit manufacture; millimetre wave integrated circuits; millimetre wave receivers; multichip modules; statistical process control; viscosity measurement; 28 GHz; ASTM method; Ag; Auger type positive displacement pump; GaAs; GaAs PHEMT; M/A-COM; adhesive; automated dispense; commercial millimeter wave multi chip module receiver; designed experiment; documented operating procedure; operator certification; operator training; silver filled epoxy; statistical process control; viscosity measurement; Certification; Continuous improvement; Costs; Gallium arsenide; Millimeter wave measurements; Millimeter wave technology; Process control; Semiconductor device measurement; Silver; Viscosity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Multichip Modules, 1997., International Conference on
Conference_Location :
Denver, CO
Print_ISBN :
0-7803-3787-5
Type :
conf
DOI :
10.1109/ICMCM.1997.581180
Filename :
581180
Link To Document :
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