DocumentCode :
3417558
Title :
Motorola fast static RAM known good die manufacturing process
Author :
Kost, Don ; Benner, Tony ; Corona, Christina ; Leal, Carlos ; Robinson, Dale ; Ward, Valerie ; Wilson, James
Author_Institution :
Motorola Inc., Austin, TX, USA
fYear :
1997
fDate :
2-4 Apr 1997
Firstpage :
245
Lastpage :
249
Abstract :
The Motorola fast static RAM division has put in place a manufacturing process for both wirebond and flip chip known good die (KGD). The goal was to manufacture KGD with the same quality and reliability as conventionally packaged die. A die level KGD process was developed which allows the reuse of the same equipment, manufacturing and quality infrastructure which is used for conventional package types. The paper discusses infrastructure reuse as it relates to the manufacturing KGD process, manufacturing flow and the process and quality procedures used to insure delivery of cost effective KGD
Keywords :
SRAM chips; flip-chip devices; integrated circuit packaging; integrated circuit reliability; lead bonding; multichip modules; quality control; die level KGD process; fast static RAM; flip chip; infrastructure reuse; known good die manufacturing process; manufacturing flow; quality infrastructure; quality procedures; reliability; wirebond; Bonding; Contacts; Costs; Manufacturing processes; Multichip modules; Packaging machines; Semiconductor device manufacture; Semiconductor device testing; Substrates; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Multichip Modules, 1997., International Conference on
Conference_Location :
Denver, CO
Print_ISBN :
0-7803-3787-5
Type :
conf
DOI :
10.1109/ICMCM.1997.581183
Filename :
581183
Link To Document :
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