Title :
A fast graph-based alternative wiring scheme for Boolean networks
Author :
Wu, Yu-Liang ; Long, Wangning ; Fan, Hongbing
Author_Institution :
Dept. of Comput. Sci. & Eng., Chinese Univ. of Hong Kong, Shatin, Hong Kong
Abstract :
Alternative wiring techniques have been shown to be very useful for many EDA problems. The currently used rewiring techniques are mainly ATPG based. In this paper, we study the approach of applying purely graph based local pattern search methods in locating alternative wires. The method searches minimal graph patterns containing alternative wires that are limited to 2 edges distant from the target wire. The experimental result shows that this scheme is very fast and has the advantage of searching both the nearby forward and backward alternative wires easily. The overall number of alternative wires searched is quite comparable (104%), compared to the forward search only RAMBO version, and the CPU time is 200 times faster. We also illustrate its usage, among many others, by a simple coupling with the SIS algebraic operations and let this rewiring tool serve as a netlist-perturbing engine for logic minimization. The coupling scheme shows a further reduction of 8.5% in area compared to applying algebraic script alone, with a nearly negligible CPU overhead spent in rewiring
Keywords :
VLSI; circuit layout CAD; graph theory; high level synthesis; integrated circuit layout; integrated logic circuits; minimisation of switching nets; network topology; search problems; Boolean networks; CPU time reduction; SIS algebraic operations; area reduction; fast graph-based alternative wiring scheme; graph based local pattern search methods; logic minimization; minimal graph patterns; netlist-perturbing engine; rewiring tool; Automatic logic units; Automatic test pattern generation; Automatic testing; Birth disorders; Boolean functions; Circuit testing; Logic circuits; Logic testing; Wires; Wiring;
Conference_Titel :
VLSI Design, 2000. Thirteenth International Conference on
Conference_Location :
Calcutta
Print_ISBN :
0-7695-0487-6
DOI :
10.1109/ICVD.2000.812620