• DocumentCode
    3417756
  • Title

    7 to 30V state-of-art power device implementation in 0.25 μm LBC7 BiCMOS-DMOS process technology

  • Author

    Pendharkar, Sameer ; Pan, Robert ; Tamura, Takehito ; Todd, Bob ; Efland, Taylor

  • Author_Institution
    Texas Instrum. Inc., Dallas, TX, USA
  • fYear
    2004
  • fDate
    24-27 May 2004
  • Firstpage
    419
  • Lastpage
    422
  • Abstract
    The performance of low-to-medium voltage power devices (7 V-30 V) implemented in an advanced 0.25 μm BiCMOS-DMOS process is presented. The devices were optimized for a range of applications in this voltage group. In particular, the lateral DMOS devices have a capability of operating with the drain fully isolated from the substrate. The Rsp-BVdss performance for these devices is shown to be very competitive with respect to similar technologies. This performance is achieved without sacrificing the requirements for square electrical and lifetime safe operating area (SOA).
  • Keywords
    BiCMOS integrated circuits; power MOSFET; power semiconductor diodes; 0.25 micron; 7 to 30 V; LBC7 BiCMOS-DMOS process technology; SOA; high voltage isolated diode; lateral DMOS devices; lifetime safe operating area; low-to-medium voltage power devices; square electrical operating area; substrate isolated drain; BiCMOS integrated circuits; Power MOSFETs; Power semiconductor diodes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices and ICs, 2004. Proceedings. ISPSD '04. The 16th International Symposium on
  • Print_ISBN
    4-88686-060-5
  • Type

    conf

  • DOI
    10.1109/ISPSD.2004.1332964
  • Filename
    1332964