Title :
Thermal Influence on 16-Bits Microcontroller Emission
Author :
Ben Dhia, S. ; Sicard, E. ; Mequignon, Y. ; Boyer, A. ; Dienot, J.M.
Author_Institution :
INSA-Toulouse, Toulouse
Abstract :
This paper deals with the thermal influence on integrated circuit performances in terms of parasitic emission. Emission measurements results conducted on a 16-bit microcontroller at extreme temperature conditions are provided, showing a difference of 10 dB between -40degC and 125degC. We detail a predictive approach for modeling the emission level variation with temperature. The simulation takes into account temperature-dependant passive and active device models. It is shown that the silicon substrate, drivers and on-chip capacitance play significant roles in the increase in emission levels when lowering the operating temperature.
Keywords :
microcontrollers; active device models; emission level variation; integrated circuit performances; microcontroller emission; onchip capacitance; parasitic emission; silicon substrate; temperature-dependant passive device; thermal influence; Circuit simulation; Electric variables measurement; Electrical resistance measurement; Electromagnetic compatibility; Integrated circuit measurements; Magnetic field measurement; Microcontrollers; Predictive models; Probes; Temperature;
Conference_Titel :
Electromagnetic Compatibility, 2007. EMC 2007. IEEE International Symposium on
Conference_Location :
Honolulu, HI
Print_ISBN :
1-4244-1349-4
Electronic_ISBN :
1-4244-1350-8
DOI :
10.1109/ISEMC.2007.158
